1.How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
1.如何在缩短设计、
低芯
成本而又不损失芯
性能
前提下完成SOC系统芯
试是芯
设计工程师和
试工程师当前所要面对
挑战。