The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固点下降薄层比较法测量熔点标
熔点的测量装置的
成与工作原理。
The structure and working principle of the devices for melting point measurement by means of thin film comparative method of cryoscopy were introduced.
介绍凝固点下降薄层比较法测量熔点标熔点的测量装置的成与工作原理。
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