We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条纹积分干涉计量理,仅用幅光载频干涉条纹图获取全部位相信息。
We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条纹积分干涉计量理,仅用幅光载频干涉条纹图获取全部位相信息。
The principle and structure of laser shearography and electronic speckle interferometry were introduced.Speckle pattern was disposed and analysed.
摘要介绍了研制激光电子剪切斑干涉成像系理及结构组成,对斑图像进行了图像处理分析。
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