How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短期、降低芯片成本而又不损失芯片性能的前提下成SOC系统芯片的测试是芯片工和测试工前所要面对的挑战。
How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短期、降低芯片成本而又不损失芯片性能的前提下成SOC系统芯片的测试是芯片工和测试工前所要面对的挑战。
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