The obtained self-assembled monolayers were characterized with water contact angle goniometry, auger electron spectroscopy and X-ray photoelectron spectroscopy.
使用接触角、俄歇电子能谱及X射线光电子能谱等方法进行表征。
The obtained self-assembled monolayers were characterized with water contact angle goniometry, auger electron spectroscopy and X-ray photoelectron spectroscopy.
使用接触角、俄歇电子能谱及X射线光电子能谱等方法进行表征。
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