The chopped waveshapes of an avalanche transistor and krytron electrooptics gates are compared by streak camera measurement.
用条纹相机测量比崩晶体管和弧光放电充气管电光开关所出的削波波形。
The chopped waveshapes of an avalanche transistor and krytron electrooptics gates are compared by streak camera measurement.
用条纹相机测量比崩晶体管和弧光放电充气管电光开关所出的削波波形。
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