1.A newly-developed microdistribution analysis method for trace elements——synchrotron radiation X-ray fluorescence analysis is introduced.
本文介绍了一种新型微量元素微区分析方法——同步辐X线荧光分析法。
2.94. The betatron and synchrotron tunes are measured frequently during the period of the machine operation and machine studies.
在加运行和机研究过程中,需要经常对束流振荡频率进行测量.
3.A new fabrication method for hollow microneedle array is proposed with three times exposures in deep X-ray lithography of synchrotron radiation and the development procedure.